Sample Preparation in TEM
Sample Preparation in TEM
Jan 17, 2018
news-medical.net
Struggling to prepare thin films for defect analysis using TEM? This webinar presents an alternative— cECCI with a ZEISS FE-SEM. Discover how this new imaging technique eliminates complex sample preparation and enables you to study defects such as dislocations and stacking faults in bulk samples with clarity and efficiency.  Watch the webinar now | ZEISS Microscopy | Facebook
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