White light interferometry (WLI) is a contact-free optical method for measuring surface height. It uses the phase difference between the light reflected off a reference mirror and the target sample to ...

White light interferometry (WLI) is a contact-free optical method for measuring surface height. It uses the phase difference between the light reflected off a reference mirror and the target sample to ...

This video shows the ContourGT-K 3D optical microscope for high-resolution surface metrology from Bruker Nano Surfaces. The ContourGT-K uses white light interferometry to determine surface topography ...

Optical profilers that employ white light interferometry are one of the most accurate and flexible metrology tools for precision three-dimensional surface characterization. They are instrumental in an ...

3D optical microscope is a key metrology technique used in a myriad of industries. White light interferometry (WLI) and confocal microscopy or laser scanning confocal microscopy (LSCM) are the other ...