SAN JOSE, Calif. — In what could simultaneously lower chip-testing costs and turn the industry upside down, a consortium in the automatic test equipment (ATE) field has expanded its charter, by ...
BEAVERTON, Oregon – Cascade Microtech Inc. announced the availability of a new radio-frequency (RF) multi-device probe card for IC testers. Dubbed the Pyramid Probe Card, the probe card allows wafer ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results