One of the common modes of scanning probe microscopy (SPM) is Magnetic force microscopy (MFM). As indicated by the name, SPM is used to map magnetic properties. On the nanoscale, MFM probes local ...

In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...

In nanotechnology and molecular biology, researchers are often severely limited by the inability to observe atoms and molecules in three dimensions. Proteins, for instance, fold into complex patterns ...

The joint development team of Professor Shibata (the University of Tokyo), JEOL Ltd. and Monash University succeeded in directly observing an atomic magnetic field, the origin of magnets (magnetic ...

A research team led by Prof. LU Qingyou from Hefei Institutes of Physical Science (HFIPS) of the Chinese Academy of Sciences (CAS) achieved a major breakthrough by creating a Magnetic Force Microscope ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

The first demonstration of an approach that inverts the standard paradigm of scanning probe microscopy raises the prospect of force sensing at the fundamental limit. The development of scanning probe ...

An international team of researchers has shown that superconductivity can be modified by coupling a superconductor to a dark electromagnetic cavity. The research opens the door to the control of a ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Scientists have observed atomic magnetic fields, the origin of magnetic forces, for the first time using an innovative Magnetic-field-free Atomic-Resolution STEM they developed. The joint development ...