Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting and counting defects in transistors — a ...

Researchers have devised and tested a new, highly sensitive method of detecting and counting defects in transistors -- a matter of urgent concern to the semiconductor industry as it develops new ...