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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...
(Nanowerk News) Standard manufacturing techniques for semiconductor devices – the technologies that make electronics possible – involve processing raw materials at high temperatures in vacuum vessels.
A new solution deposition process for semiconductors yields high-performing transistors by introducing more defects, counterintuitively. Researchers used these devices to construct high- speed logic ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Across the full range of semiconductor device types and design nodes, there is a drive to produce chips with significantly higher quality. Automotive, IoT and other industrial applications require ...
Manijeh Razeghi, Walter P. Murphy Professor has been named Conference Chair of the Workshop on Defects in Wide Band Gap Semiconductors (WBG), which will be held on Monday, September 23, 2014 at the ...
There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...
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