Interesting Engineering on MSN

Korean scientists detect hidden defects in solar cells with 1,000x sensitivity boost

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
Tech Xplore on MSN

Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
EurekAlert!

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Nature

Semiconductor Wafer Defect Pattern Recognition and Classification

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
AZoNano

How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors

Photothermal AFM-IR is a highly effective method for nanoscale chemical analysis, ideally suited to the stringent requirements of semiconductor research and production. By integrating the spatial ...
Purdue University

Cutting-edge imaging, AI research seeks out minuscule defects in chips

WEST LAFAYETTE, Ind. — A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car’s steering to making your laptop ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.