Fig. 1 JTAG boundary-scan outfits each pin of a digital device with test registers that can stimulate or record I/O data. Boundary-scan technology arose to simplify the testing of connections on ...

Boundary Scan: What Is It? Boundary scan test techniques were first discussed in the late 1980s. At the time, experts believed that the growing complexity of chips would have a serious effect on an ...

Enhancement Reduces Test Development Costs and Improves Time-To-Market SAN JOSE, Calif. -- April 2, 2009-- LogicVision, Inc. (Nasdaq: LGVN), a leading provider of semiconductor built-in-self-test ...

Today, PCBs are becoming more and more complex, and that means adequate test coverage is becoming harder and harder to achieve. Moreover, every test methodology has its limitations. As a result, many ...

At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...