Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...
Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...
Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...
Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...
(Nanowerk News) Nanosurf, a leading provider of cutting-edge atomic force microscope (AFM) measurement equipment, offers fully automated, clean-room compliant AFM measurement solutions for the ...
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