Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dimension XR scanning probe microscope ...

PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and piezo scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on ...

New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, ...

InSight 300 is a fabrication-ready, automated atomic force microscope (AAFM) engineered for dependable and economical inline metrology in high-volume semiconductor production settings. Boasting a ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The InSight 300 is a fab-ready automated ...

Three-dimensional atomic force microscopy (3D-AFM) is a technique used for probing the distribution of solvent molecules at solid–liquid interfaces. Initially applied for studying situations where the ...

Negative-stiffness vibration isolators can easily support the heavy weight of a combined AFM/micro-Raman system, and isolate it The need for precise vibration isolation with scanning probe microscopy ...

Soft materials, such as colloids, polymers, gels, emulsions, and liquid crystals, are extensively used in various scientific and industrial applications. Atomic force microscopy (AFM) has a high force ...

New NE-AFM method measures nuclear stiffness in living cells. It shows cancer nuclei change softness with chromatin and environment, aiding diagnosis and treatment. By employing a technique called ...